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This Support Note describes a procedure to take electric force and surface potential measurements simultaneously with topography scanning - the so called single pass technique .
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Conducting atomic force microscopy (C-AFM) is an important technique in the study nanoscale charge transport properties of materials, and is of interest in the growing field of energy-related research. Conjugated polyelectrolytes (CPEs) are a particularly interesting class of materials, as they have been used in multiple applications such as an optical