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By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy that extends these advantages even further, enabling higher resolution at higher speed while retaining the nondestructive, low-force qualities that make TappingMode AFM so popular. While contact mode force curves are typically easier to interpret than
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The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number of recent AFM mode innovations have taken aim at
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HarmoniX Nanoscale Material Property Mapping mode with fluorescence microscopy is used to probe the surface characteristics of tissues isolated from the wheat grain. The resulting data provides new insights into this essential ingredient in human nutrition.