-
Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced Raman Scattering”: · Educates about AFM and Raman spectroscopy and explains the benefits of combining them in a straightforward way. · Highlights Bruker’s unique offerings in the field, the Innova-IRIS, Catalyst-IRIS, and ICON
-
Combines Bruker's unique PeakForce Tapping technology with FM KPFM detection to enable quantitative, highest resolution workfunction mapping with correlated nanomechanics.
-
Correlated Imaging & Latest TERS Advances
-
Bruker’s closed electrochemical cells enable a wide range of new electrochemical atomic force microscopy (ECAFM) research. Available for Dimension Icon® and Dimension Edge™ AFMs, the cells have been designed for the widest solvent compatibility and ease of setup, even inside a glove box. In addition, Bruker’s unique ScanAsyst®
-
-
PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce
-
ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter
-
Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation,