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Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of
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Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced Raman Scattering”: · Educates about AFM and Raman spectroscopy and explains the benefits of combining them in a straightforward way. · Highlights Bruker’s unique offerings in the field, the Innova-IRIS, Catalyst-IRIS, and ICON
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Correlated Imaging & Latest TERS Advances
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Innova-IRIS AFM-Raman Research Platform.
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Latest brochure about our Innova research AFM platform. Updated to reflect latest v8 user interface, high resolution origami DNA images, and extensive accessories list including AFM-Raman option.
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Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of chemistry that augments the
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The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling microscopy (STM) was soon recognized and culminated in the award of half the 1986 Nobel Prize in Physics to Binnig and Rohrer. Early STM work focused mainly
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