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  • AFM-Raman Solutions Brochure

    Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of
    Posted to Brochures & Data Sheets (MediaGallery) by Tracy Krainer on Tue, May 14 2013
  • AFM-Raman Solutions

    Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of chemistry that augments the
    Posted to Brochures & Data Sheets (MediaGallery) by Anonymous on Wed, Jul 7 2010
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