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  • Dimension Icon Brochure

    Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation,
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
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