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The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number of recent AFM mode innovations have taken aim at
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HarmoniX Nanoscale Material Property Mapping mode with fluorescence microscopy is used to probe the surface characteristics of tissues isolated from the wheat grain. The resulting data provides new insights into this essential ingredient in human nutrition.