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The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number of recent AFM mode innovations have taken aim at
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The VITA module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a material with nanoscale spatial resolution.