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Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
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The standard cross section fibre epoxy SThM sample imaged using the regular GLA probes but instead of contact mode based we are using the default ScanAsyst workspace. The thermal contrast is similar to that seen in the contact mode based approach.
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The cycle averaging of Tapping limits performance because 1) the high resolution tip-sample interaction only occurs when the tip is close to the sample, and this is a fraction of the cycle, and 2) at low imaging forces, the effects of long range forces dominate the cycle. (This is also why atomic Tapping images are done in fluid. . . eliminate the long
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An atomic resolution image of Calcite, this time taken on he Dimension Icon (90um scanner, large sample platform, SNL+ probe) showing the height and stiffness channels. (In the software, this is called Modulus, however, at the atom level, modulus is not defined since it is a continuum property. Here we simply note that areas where the force curve slope
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The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new detection mode called peak force. Duration 5:54 min