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  • Bruker's AFM-Raman Solutions

    Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
    Posted to NanoTheater (MediaGallery) by Thomas Mueller on Mon, Feb 2 2015
  • PFT based SThM on Fibre/Epoxy Sample

    The standard cross section fibre epoxy SThM sample imaged using the regular GLA probes but instead of contact mode based we are using the default ScanAsyst workspace. The thermal contrast is similar to that seen in the contact mode based approach.
    Posted to Other (MediaGallery) by Ian Armstrong on Fri, Oct 4 2013
  • PFT and Cycle Averaging

    The cycle averaging of Tapping limits performance because 1) the high resolution tip-sample interaction only occurs when the tip is close to the sample, and this is a fraction of the cycle, and 2) at low imaging forces, the effects of long range forces dominate the cycle. (This is also why atomic Tapping images are done in fluid. . . eliminate the long
    Posted to Other (MediaGallery) by Stephen Minne on Thu, May 3 2012
  • Dimension Icon Atomic Resolution with Mechanical Property Mapping

    An atomic resolution image of Calcite, this time taken on he Dimension Icon (90um scanner, large sample platform, SNL+ probe) showing the height and stiffness channels. (In the software, this is called Modulus, however, at the atom level, modulus is not defined since it is a continuum property. Here we simply note that areas where the force curve slope
    Posted to Other (MediaGallery) by Stephen Minne on Tue, May 1 2012
  • Dimension Icon Video, AZnano on YouTube

    The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new detection mode called peak force. Duration 5:54 min
    Posted to NanoTheater (MediaGallery) by BrukerApplications on Mon, Mar 8 2010
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