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The Dimension V AFM/Nanomechanical Tester from Veeco - Key Features and Operation Chris Orsulak from Veeco takes us for a tour of the Dimension V, which combines an atomic force microscope (AFM) with a nanomechanical tester. This is achieved using a specifically designed probe. The Dimension V is able to measure properties such as stiffness, adhesion
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The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new detection mode called peak force. Duration 5:54 min
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. Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the process of mounting cantilevers and the alignment
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Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation,
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Conducting atomic force microscopy (C-AFM) is an important technique in the study nanoscale charge transport properties of materials, and is of interest in the growing field of energy-related research. Conjugated polyelectrolytes (CPEs) are a particularly interesting class of materials, as they have been used in multiple applications such as an optical