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PeakForce Tapping sequence highlighting unique lattice defects, as well as adsorbates. In this sequence you can also see 2 different adatoms appear on the surface and then disappear in subsequent frames.
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Another great advantage of PeakForce Tapping, particularly when imaging at the atomic scale, is you can obtain a forces curve for any pixel in the image. Here are two examples of force distance curves collected during Peak Force Tapping imaging. One set of approach / retract curves was collected on calcite and the other was collected on mica. The mica
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The cycle averaging of Tapping limits performance because 1) the high resolution tip-sample interaction only occurs when the tip is close to the sample, and this is a fraction of the cycle, and 2) at low imaging forces, the effects of long range forces dominate the cycle. (This is also why atomic Tapping images are done in fluid. . . eliminate the long
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Image of the cleavage plane of calcite taken with the Dimension FastScan using a standard cantilever (SNL+, 60um) in water. In the image you can see two crystal planes (brown and blue) separated by the dissolving crystal front (red). We have overlaid the atomic model of the oxygen atoms in the calcite on the lower plane, and there you can see the zig
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See this new paper on ultrahigh resolution imaging and mechanical mapping of bacteriorhodopsin. http://pubs.acs.org/doi/abs/10.1021/nl202351t. I thought I would post this link as nice example of the science that can be done using the AFMs high resolution imaging power, coupled with the inherent information available from mechanical tip-sample interaction
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I have received a number of questions if FastScan (our High Speed AFM) works with ScanAsyst (our Auto-Optimization algorithms). It does - and this video link demonstrates that by showing unattended high speed imaging on a diverse set of challenging samples. (http://www.youtube.com/user/BrukerNano?feature=mhee#p/u/0/7bi2YEgie_k) In the video are several
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When compared to other common microscopy techniques (optical, SEM, TEM), the atomic force microscope’s (AFM’s) broad potential for nanoscale imaging and characterization of numerous physical surface properties has been somewhat offset by its slow imaging speed. Thus, the AFM has sometimes been seen as a powerful “specialty tool”
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It’s good to see some community attempts at replicating the performance of the Dimension FastScan. The video is of a 1um, 512x512, 23Hz, scan of Celgard® taken with the Dimension FastScan. This demonstration is over twice as fast as the 10Hz video we showed previously, additionally we demonstrate the Celgard® with the mesh oriented a couple
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HF Etched Mica. The video shows a Survey at 20um @ 4.8Hz, followed by a high resolution image at 4um @ 20Hz, followed by a video at 0.66um 55Hz. Hard flat samples are not that challenging for a high speed system because they don't challenge the z-actuator or slew rate (power) of the electronics.
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I was reading an AFM site and saw a contrived claim trying to make a comparison that was over 50% off the benchmark and thought it would be a good topic to open up for discussion. The comment was to the effect of: by scanning at a slower scan speed we are actually going faster because our poor scanner dynamics require so much rounding we have to make