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  • PeakForce Tapping Mica Sequence

    PeakForce Tapping sequence highlighting unique lattice defects, as well as adsorbates. In this sequence you can also see 2 different adatoms appear on the surface and then disappear in subsequent frames.
    Posted to Other (MediaGallery) by Stephen Minne on Wed, May 16 2012
  • PeakForce Capture on Calcite and Mica

    Another great advantage of PeakForce Tapping, particularly when imaging at the atomic scale, is you can obtain a forces curve for any pixel in the image. Here are two examples of force distance curves collected during Peak Force Tapping imaging. One set of approach / retract curves was collected on calcite and the other was collected on mica. The mica
    Posted to Other (MediaGallery) by Stephen Minne on Sun, May 6 2012
  • PFT and Cycle Averaging

    The cycle averaging of Tapping limits performance because 1) the high resolution tip-sample interaction only occurs when the tip is close to the sample, and this is a fraction of the cycle, and 2) at low imaging forces, the effects of long range forces dominate the cycle. (This is also why atomic Tapping images are done in fluid. . . eliminate the long
    Posted to Other (MediaGallery) by Stephen Minne on Thu, May 3 2012
  • FastScan Atomic Resolution on Calcite: Large Sample Platform, Large Cantilever!

    Image of the cleavage plane of calcite taken with the Dimension FastScan using a standard cantilever (SNL+, 60um) in water. In the image you can see two crystal planes (brown and blue) separated by the dissolving crystal front (red). We have overlaid the atomic model of the oxygen atoms in the calcite on the lower plane, and there you can see the zig
    Posted to Other (MediaGallery) by Stephen Minne on Wed, Apr 25 2012
  • Bacteriorhodopsin imaging with Bruker Dimension FastScan and Peak Force Tapping

    See this new paper on ultrahigh resolution imaging and mechanical mapping of bacteriorhodopsin. http://pubs.acs.org/doi/abs/10.1021/nl202351t. I thought I would post this link as nice example of the science that can be done using the AFMs high resolution imaging power, coupled with the inherent information available from mechanical tip-sample interaction
    Posted to Webinars and Video (MediaGallery) by Stephen Minne on Tue, Sep 13 2011
  • Fast Automated AFMs: Easier than SEM?

    I have received a number of questions if FastScan (our High Speed AFM) works with ScanAsyst (our Auto-Optimization algorithms). It does - and this video link demonstrates that by showing unattended high speed imaging on a diverse set of challenging samples. (http://www.youtube.com/user/BrukerNano?feature=mhee#p/u/0/7bi2YEgie_k) In the video are several
    Posted to Webinars and Video (MediaGallery) by Stephen Minne on Wed, Aug 17 2011
  • Survey, Screening, Dynamics: A No-Compromise Approach to High-Speed Atomic Force Microscopy

    When compared to other common microscopy techniques (optical, SEM, TEM), the atomic force microscope’s (AFM’s) broad potential for nanoscale imaging and characterization of numerous physical surface properties has been somewhat offset by its slow imaging speed. Thus, the AFM has sometimes been seen as a powerful “specialty tool”
    Posted to Application Notes (MediaGallery) by Stephen Minne on Fri, Jul 8 2011
  • Celgard(R), 1um, 23Hz, Perpendicular Mesh Orientation

    It’s good to see some community attempts at replicating the performance of the Dimension FastScan. The video is of a 1um, 512x512, 23Hz, scan of Celgard® taken with the Dimension FastScan. This demonstration is over twice as fast as the 10Hz video we showed previously, additionally we demonstrate the Celgard® with the mesh oriented a couple
    Posted to Webinars and Video (MediaGallery) by Stephen Minne on Sun, Jun 12 2011
  • Dimension FastScan Etched Mica, 55Hz

    HF Etched Mica. The video shows a Survey at 20um @ 4.8Hz, followed by a high resolution image at 4um @ 20Hz, followed by a video at 0.66um 55Hz. Hard flat samples are not that challenging for a high speed system because they don't challenge the z-actuator or slew rate (power) of the electronics.
    Posted to Webinars and Video (MediaGallery) by Stephen Minne on Sat, Jun 11 2011
  • Dimension FastScan Productivity Grand Challenge

    I was reading an AFM site and saw a contrived claim trying to make a comparison that was over 50% off the benchmark and thought it would be a good topic to open up for discussion. The comment was to the effect of: by scanning at a slower scan speed we are actually going faster because our poor scanner dynamics require so much rounding we have to make
    Posted to Webinars and Video (MediaGallery) by Stephen Minne on Sat, Jun 11 2011
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