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PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma
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PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma
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AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Traditionally, these measurements have been categorized into two classes: Conductive AFM (CAFM) , which covers the higher current range (sub-nA up to μA), and Tunneling AFM (TUNA) , which covers the lower current
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The ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
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The Atomic Force Microscopy Webinar Series: High-Resolution Imaging and Quantitative Nanomechanical Mapping Using Peak Force Tapping AFM OVERVIEW This webinar will present the principle and applications of Veeco’s revolutionary Peak Force Tapping™ technology, which operates at the sub-resonance frequency of cantilevers and uses the peak
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PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce
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ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter
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The best research instruments not only acquire the intended data, but actually increase productivity. Bruker’s BioScope Catalyst Atomic Force Microscope (AFM) accelerates innovative research by reducing the time and effort needed to combine the proven techniques of light microscopy with the unique benefits of atomic force microscopy.
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Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation,