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Atomic force microscopy (AFM) is used to investigate structural aspects of cataract formation. High-resolution imaging of native lens membranes and the constitutive protein components was achieved using a customized Veeco atomic force microscope.
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Multi-Modal Imaging and Measurements Correlating Optical and Atomic Force Microscopy
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The VITA module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a material with nanoscale spatial resolution.
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The best research instruments not only acquire the intended data, but actually increase productivity. Bruker’s BioScope Catalyst Atomic Force Microscope (AFM) accelerates innovative research by reducing the time and effort needed to combine the proven techniques of light microscopy with the unique benefits of atomic force microscopy.
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Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation,