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This datasheet describes the NEOS – a high resolution surface inspection microscope. NEOS combines AFM with a research grade upright optical microscope. Application Areas for the NEOS: Metallurgy Coatings (on metal, glass, etc.) Optical Industry (Glass, polymer for glasses and lenses) Fibers Micro Patterned Devices/Laser Ablation Defects in SiC
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Brochure describing Bruker's BioScope Catalyst Perfusing Stage Incubator accessory.
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The MultiMode® is the world’s most field-proven scanning probe microscope (SPM), with thousands of systems installed worldwide. Its success is based on its superior resolution and performance, its unparalleled versatility, and its proven record of productivity and reliability. Now, the MultiMode 8, featuring Veeco’s proprietary ScanAsyst™
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ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
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ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
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PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
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PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
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PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce
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