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  • Dimension FastScan Brochure

    Posted to Brochures & Data Sheets (MediaGallery) by Hector Lara on Mon, May 2 2011
  • ScanAsyst Brochure - Low Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • ScanAsyst Brochure - High Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure - Low Resolution

    PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure - High Resolution

    PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure

    PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
  • ScanAsyst Brochure

    ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
  • Dimension Icon Brochure

    Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation,
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
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