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  • ScanAsyst Brochure - Low Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • ScanAsyst Brochure - High Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure

    PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
  • ScanAsyst Brochure

    ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
  • BioScope Catalyst Brochure

    The best research instruments not only acquire the intended data, but actually increase productivity. Bruker’s BioScope Catalyst Atomic Force Microscope (AFM) accelerates innovative research by reducing the time and effort needed to combine the proven techniques of light microscopy with the unique benefits of atomic force microscopy.
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
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