-
To apply or view complete description, please follow this link: https://wwcareers-bruker.icims.com/jobs/1436/sales-applications-scientist%2c-afm/job?mobile=false&width=940&height=500&bga=true&needsRedirect=false Overview: As one of the world’s leading analytical instrumentation companies, Bruker covers a broad spectrum of advanced
-
Bruker Supports 2013 Marine Biological Laboratory Physiology Course August 2013 Students Experience AFM's High-Resolution Imaging and Mechanical Measurement Capabilities Bruker's support of the Marine Biological Laboratory (MBL) Physiology Course at Woods Hole has now stretched to six years. The long-running summer course is one of the country's
-
Innovation with Integrity PeakForce Tapping Enables More Accurate KPFM August 2013 KPFM provides information about sample electrostatics with nanoscale spatial resolution in applications ranging from polymer research and the characterization of nano-materials to advanced studies of metals, alloys, organic photovoltaics, semiconductors, and graphene
-
Innovation with Integrity Bruker Announces Grand Opening of Newly Renovated AFM Facility August 2013 June 5 was the grand opening of the much anticipated renovation of the AFM headquarters of Bruker’s Nano Surfaces division in Santa Barbara, CA. The $4.4 million dollar, year-long renovation was enacted to provide better customer service, technical
-
Innovation with Integrity Dimension Edge Now Available with PeakForce Tapping and ScanAsyst August 2013 PeakForce Tapping™ is the most significant breakthrough in AFM technology since the advent of TappingMode™. With its inclusion on the Dimension Edge™ , a much greater number of researchers have access to the revolutionary capabilities
-
A Great Year for AFM August 2013 David Rossi Executive Vice President and General Manager Bruker's AFM Business Bruker completes much anticipated renovation of the AFM headquarters of Bruker’s Nano Surfaces division in Santa Barbara, CA PeakForce Tapping is quickly becoming the new industry standard for AFM techniques and continues to cement
-
Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of
-
Innovation with Integrity Having touble viewing this email? Click here to view in your browser. Atomic Force Microscopy David Rossi Executive Vice President and General Manager Bruker's AFM Business Enabling AFM Advancement Bruker has always been committed to partnering with our customers to meet their advanced research needs. Based on these interactions
-
Innovation with Integrity Enabling AFM Advancement April 2013 David Rossi Executive Vice President and General Manager Bruker's AFM Business Topographic map of graphene flake prepared on silicon dioxide, reveals expected 300pm graphene step between successive layers. In the discipline of Tip-Enhanced Raman Spectroscopy (TERS), we continue to introduce
-
Innovation with Integrity Bruker Fuels the Future of Graphene April 2013 AFM topography image showing wrinkles in graphene layers at area of interest. This modulus image shows fine structures with greater compliance seen as darker areas on the modulus map image. Atomic force microscopy has been part of graphene research since Andre Geim and Konstantin