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Innovation with Integrity Proprietary High-Contrast Probe Tips on Innova-IRIS AFM Enable First Complete Commercial TERS Solution April 2013 The single biggest issue preventing further adoption of the powerful Tip-Enhanced Raman Spectroscopy (TERS) technique is the lack of available high-performance probes. With the release of the new IRIS TERS Probes
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Innovation with Integrity Seeing at the Nanoscale Is Coming to a Venue Near You April 2013 After over a decade of extremely popular once-a-year conferences, Seeing at the Nanoscale is expanding to multiple locations in 2013. The year-on-year growing participation, interest, and valued interactions were a strong catalyst for Bruker's new regional
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Seeing at the Nanoscale 2013 with Nuance Don’t miss this opportunity to meet your peers, discover next-generation nanotechnology, and be the first to hear about the exciting trends and industry updates. This year’s conference features an incredible mix of visionaries—all ready to give you an insider’s view on the future of nanotechnology
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Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions in ambient conditions. Contamination, oxidation
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Innova-IRIS AFM-Raman Research Platform.
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Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition of a sample. When these techniques are further
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Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about the surface properties of a sample, yet their respective user base is often quite different. There are many important application reasons to combine these two technologies, and this application note looks both at the complementary information gained from
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October 2011, Issue 03 Product Innovations - Industry Leaders are Talking Dimension FastScan The Dimension FastScan improves imaging speed without sacrificing nanoscale resolution, enabling users to work hundreds of times faster than is possible with other commercial AFM systems and delivering results in seconds or minutes instead of hours or days.
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The Dimension FastScan ™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs Atomic Force Microscopy Webinar Series High Speed AFM Imaging: Bruker Dimension FastScan — a Breakthrough in AFM Technology Survey, Screening
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Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible with other commercial AFM systems. It is simply