The Nanoscale World

Search

  • April 2013, Issue 1

    Innovation with Integrity Having touble viewing this email? Click here to view in your browser. Atomic Force Microscopy David Rossi Executive Vice President and General Manager Bruker's AFM Business Enabling AFM Advancement Bruker has always been committed to partnering with our customers to meet their advanced research needs. Based on these interactions
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
  • High Resolution Quantitative Kelvin Probe Force Microscopy - Principles and Applications

    Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions in ambient conditions. Contamination, oxidation
    Posted to Webinars and Video (MediaGallery) by Thomas Mueller on Fri, Oct 12 2012
Page 1 of 1 (2 items) | More Search Options
Copyright (c) 2011 Bruker Instruments