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Innovation with Integrity Bruker Fuels the Future of Graphene April 2013 AFM topography image showing wrinkles in graphene layers at area of interest. This modulus image shows fine structures with greater compliance seen as darker areas on the modulus map image. Atomic force microscopy has been part of graphene research since Andre Geim and Konstantin
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. Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the process of mounting cantilevers and the alignment
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The atomic force microscope (AFM) offers extraordinarily high resolution in force measurement applications, routinely yielding useful data down to the thermal noise floor of the cantilever, typically about 10pN. This along with the ease with which it is applied to many biological systems has made it a popular tool for studying such things as the specific