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Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
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Bruker-axs.com | +1 805 967-1400 NANOVATIONS Newsletter Vol. 2 August 2012 Seeing at the Nanoscale 2012 Continued Innovation Delivers the Ultimate in AFM Technology As the world leader in AFM technology and manufacturing, Bruker takes its responsibility to support the industry with continual innovation and customer service very seriously. In product
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October 2011, Issue 03 Advancing TERS Research through the Combination of Industry-Leading Atomic Force Microscopy & Raman Spectroscopy Also available: inVia / Catalyst-IRIS combined system for transparent samples (transmission geometry). Please contact Bruker or Renishaw for further details. Researchers no longer have to worry about the hassles
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Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of chemistry that augments the