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The NSIVa thermal tune function is limited in frequency by the data acquisition rate of the NSIVa. The maximum frequency that can be tuned is about 30KHz. The data acquisition rate on the NSV is 50MHz, so it can tune cantilevers up to 2MHz with no problem (assuming that they are not too stiff). The thermal tune function on the NSIVa is available for
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I'm trying to demonstrate the tip width of a "1-nm radius" tip by scanning isolated features (bumps or ridges). Does anyone have a favorite specimen that has features 1 nm wide?
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Abstract Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here
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How do you know the Modulus value for the reference sample?
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What standards ecan be used for PeakForce calibration? What range of moduli can be investigated?
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This talk of calibration standards has brought up another question- where to get electrical reference standards for techniques such as scanning spreading resistance (SSRM) or scanning capacitance (SCM)? I'm talking about a stack of layers of known doping concentration and thicknesses of epitaxially grown silicon, usually set up as a sequence of
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We calibrate the XYZ scan axes of our AFM using a traceable height and pitch standard made of thermally grown silicon dioxide on silicon. The specimen contains these patterns: 10 um pitch, 2-dimensional array of pits, nominally 200 nm deep 2 um pitch, 1-dimensional array of ridges, same depth as the pits. The manufacturer's certificate of traceability
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Diminshing feature size, combined with requirements for higher throughput during quality control, have steadily increased demand for Critical Dimension Atomic Force Microscopy (CD AFM). In contrast to Scanning Electron Microscopy (SEM), the CD AFM provides a solution for nondestructive and rapid 3-dimensional measurementof features with 1.5nm 3s repeatability
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Atomic force microscopy (AFM) is being used in a great variety of force measurement applications, including investigating the unfolding pathways of native membrane proteins, probing the structure of single polysaccharide molecules, and monitoring the response of living cells to biochemical stimuli. All of these techniques rely on the accurate determination