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  • Raman and TERS Application Note

    Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced Raman Scattering”: · Educates about AFM and Raman spectroscopy and explains the benefits of combining them in a straightforward way. · Highlights Bruker’s unique offerings in the field, the Innova-IRIS, Catalyst-IRIS, and ICON
    Posted to Application Notes (MediaGallery) by Thomas Mueller on Mon, Feb 25 2013
  • AFM-Raman and TERS - Webinar Slides

    Correlated Imaging & Latest TERS Advances
    Posted to Webinars and Video (MediaGallery) by Thomas Mueller on Thu, Oct 4 2012
  • New Applications Note on ScanAsyst and PeakForce Tapping

    We just published a new Applications Note for download here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/1548.aspx PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM) imaging techniques that have been recently introduced by Bruker. In this application note we will explain the underlying physical
    Posted to SPM Digest (Forum) by Anonymous on Fri, May 6 2011
  • Two new videos from AZnano: Catalyst and Icon

    Posted to News (Forum) by Stephen Minne on Mon, Mar 8 2010
  • ScanAsyst Brochure - Low Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • ScanAsyst Brochure - High Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure - Low Resolution

    PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure - High Resolution

    PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure

    PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
  • ScanAsyst Brochure

    ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter
    Posted to Brochures & Data Sheets (MediaGallery) by Stephen Minne on Wed, Dec 16 2009
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