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  • HarmoniXTM Microscopy for Materials Characterization

    By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy that extends these advantages even further, enabling higher resolution at higher speed while retaining the nondestructive, low-force qualities that make TappingMode AFM so popular. While contact mode force curves are typically easier to interpret than
    Posted to Application Notes (MediaGallery) by Stephen Minne on Tue, Jul 6 2010
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