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  • New Applications Note on ScanAsyst and PeakForce Tapping

    We just published a new Applications Note for download here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/1548.aspx PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM) imaging techniques that have been recently introduced by Bruker. In this application note we will explain the underlying physical
    Posted to SPM Digest (Forum) by Anonymous on Fri, May 6 2011
  • Nice new paper on Graphene using Dimension Icon

    Nice paper just published on Graphene using Dimension Icon by Tim Burnett,Rositza Yakimova,and Olga Kazakova of National Physical Laboratory and Linkoping University. View at: nl200581g ABSTRACT: Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy (EFM) in ambient conditions and at elevated
    Posted to SPM Digest (Forum) by Stephen Minne on Wed, May 4 2011
  • Dimension FastScan Brochure

    Posted to Brochures & Data Sheets (MediaGallery) by Hector Lara on Mon, May 2 2011
  • Re: Electrical measurements on Heater Cooler

    Tim, You are correct in this. The quickest solution is to use the regular Icon tip holder (rather than the heated H/C tip holder) to do this measurement. The regular tip holder will enable the PFM, however, you will not be able to heat the tip. This should be no problem if your experiment is at less than 100C; it may be OK if you are going hotter, please
    Posted to SPM Digest (Forum) by Stephen Minne on Wed, Nov 17 2010
  • Two new videos from AZnano: Catalyst and Icon

    Posted to News (Forum) by Stephen Minne on Mon, Mar 8 2010
  • Dimension Icon Video, AZnano on YouTube

    The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new detection mode called peak force. Duration 5:54 min
    Posted to NanoTheater (MediaGallery) by BrukerApplications on Mon, Mar 8 2010
  • ScanAsyst Brochure - Low Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • ScanAsyst Brochure - High Resolution

    ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure - Low Resolution

    PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
  • PeakForce QNM Brochure - High Resolution

    PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
    Posted to Peak Force Tapping (MediaGallery) by Stephen Minne on Thu, Dec 24 2009
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