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Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
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Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of
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The question came up again on how to read the *.flt files generated by the Dimension Edge and Innova. Here is a pdf explaining the data structure. Please note that the data are stored in "float" and NOT in "integer". Stefan Data Format.pdf
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Innovation with Integrity Proprietary High-Contrast Probe Tips on Innova-IRIS AFM Enable First Complete Commercial TERS Solution April 2013 The single biggest issue preventing further adoption of the powerful Tip-Enhanced Raman Spectroscopy (TERS) technique is the lack of available high-performance probes. With the release of the new IRIS TERS Probes
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Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced Raman Scattering”: · Educates about AFM and Raman spectroscopy and explains the benefits of combining them in a straightforward way. · Highlights Bruker’s unique offerings in the field, the Innova-IRIS, Catalyst-IRIS, and ICON
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Correlated Imaging & Latest TERS Advances
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Hi Evangelia, I assume that you are using the analog thermal box for your measurement. That box has been superceeded for quite some years by a newer software controlled version. Having said that, it always worked fine if one did not mind setting the resistance settings "by hand". I dropped a PDF version of the user manual describing the operation
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Hi, Yes there is a way. When you peform a lithography experiment selecting the "by depth" option, the system will turn the z-feedback off and raise the sample by the depth you specified. If you have tilt on your sample this can of course lead to errors in depth. In order to compensate for that you might want to got to tools->leveling and
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Innova-IRIS AFM-Raman Research Platform.