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  • Innova

    Latest brochure about our Innova research AFM platform. Updated to reflect latest v8 user interface, high resolution origami DNA images, and extensive accessories list including AFM-Raman option.
    Posted to Brochures & Data Sheets (MediaGallery) by Thomas Mueller on Tue, Nov 22 2011
  • Re: Local anoidic oxidation lithography

    Hi Saumil, That chip carrier that you pointed out allows you to bias the tip. With the regular carrier the tip is always grounded. In order to apply a bias (which the software always allows) you have to route the bias voltage to the sample. So if you can live with biasing the sample you don't need any additional parts. Stefan
    Posted to SPM Digest (Forum) by Anonymous on Tue, Nov 15 2011
  • Re: Force distance measurements with Innova

    Hi dmr42c, You may want to read up on elastic deformation and the St. Venant's law. As a simple rule of thumb you can assume that the tip deforms an area roughly 10x the diameter. So for a 5nm tip you will need a sample >50nm thick to be free from substrate effects. Best, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Wed, Nov 2 2011
  • Re: CAFM

    If possible I use silver epoxi or similar, indium works too to achieve proper conductivity from sample to metal puck. If already mounted with tape you may try to paint some silver over the edges. The Innova has a slight offset in the Bias voltage so 0V may not be 0V. You may want to measure that in order to be able to correct later if desired. Good
    Posted to SPM Digest (Forum) by Anonymous on Tue, Oct 18 2011
  • Re: 2D array of locations with probe positioning

    Hi Zhuoyang, It is actually quite easy to generate an array of points. When you select the frame symbol in the probe positioning dialog a box pops up to ask you to select the number of points in the rectangle. After that you can position the reactangle in your image and select the size. If you are happy with the location and size please "right
    Posted to SPM Digest (Forum) by Anonymous on Tue, Jun 28 2011
  • Re: Reducing imaging forces

    Hi Zhuoyang, In contact mode it is indeed as you say. Once in feedback one can reduce the imaging force until the cantilever alsmost pulls off the surface. For practical reasons you probably want to reduce uintil the cantilever pulls off and then go back into contact and stay with a setpoint a bit above the pull off point. Operating here might not be
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 24 2011
  • Re: Local anoidic oxidation lithography

    Hi Narenda, On the Innova you can to use the "Nanoplot" option for lithographic experiments. In order to start Nanoplot you simply "right click" on any previously acquired image and select the "send to Nanoplot" option. In the Nanoplot setting you want to select the type of lithography you would like to perform. In your
    Posted to SPM Digest (Forum) by Anonymous on Wed, May 11 2011
  • Re: Frequency Modulation

    Hi Zhuoyang, The Open Harware allows you to output the signals necessary to feed a FM detection "box" as well as allows you to use an external signal as "feedback". What you have to provide is any additional electronics required. Best, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Fri, Apr 29 2011
  • AFM-Raman Solutions

    Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of chemistry that augments the
    Posted to Brochures & Data Sheets (MediaGallery) by Anonymous on Wed, Jul 7 2010
  • Scanning Tunneling Microscopy: A Tool for Studying Self-Assembly and Model Systems for Molecular Devices

    The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling microscopy (STM) was soon recognized and culminated in the award of half the 1986 Nobel Prize in Physics to Binnig and Rohrer. Early STM work focused mainly
    Posted to Application Notes (MediaGallery) by BrukerApplications on Mon, Jan 4 2010
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