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2-page datasheet showcasing Bruker's new turnkey AFM system configurations for environmental control. Guaranteeing 1ppm oxygen and water levels while at the same time guaranteeing highest AFM performance. Enabling research on sensitive samples such as OPVs and Lithium batteries. Ideal in combination with PeakForce TUNA or the new electrochemistry
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2-page datasheet showcasing the unique benefits of PeakForce TUNA for obtaining the highest resolution conductivity data along with correlated nanomechanical information, on the most fragile samples, including OPVs, Lithium battery electrodes, and carbon nanotube structures.
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I have received a number of questions if FastScan (our High Speed AFM) works with ScanAsyst (our Auto-Optimization algorithms). It does - and this video link demonstrates that by showing unattended high speed imaging on a diverse set of challenging samples. (http://www.youtube.com/user/BrukerNano?feature=mhee#p/u/0/7bi2YEgie_k) In the video are several
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Peak Force QNM Frequently Asked Questions
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We just published a new Applications Note for download here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/1548.aspx PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM) imaging techniques that have been recently introduced by Bruker. In this application note we will explain the underlying physical
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For those interested in dynamic imaging with the AFM: Attached is a link to a Dimesnion FastScan video of DNA taken in tapping mode in fluid at a rate 1 frame per second. We took this data in collaboration with Y. Lyubchenko, at the University of Nebraska Medical Center, as a proof of concept experiment. Here we use the enhanced bandwidth of the system
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Our new Dimension FastScan Atomic Force Microscope (the world's fastest AFM) will enable you to scan once and get all the details you need. Contact Bruker today to see for yourself the difference FastScan can make in your application. Find more info at www.bruker.com/fastscan
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PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM) imaging techniques that have been recently introduced by Bruker. In this application note we will explain the underlying physical background, fit PFT into the framework of existing AFM modes, and show the benefits of these new modes through application examples
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Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible with other commercial AFM systems. It is simply