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PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma
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PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma
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By the probe in question, I suspect you are using TappingMode. I would perhaps approach your problem from a different direction and recommend you scan with Peak Force Tapping. We have found the PFT can image with considerably less tip damage and wear. This is a discussed a bit in this post: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums
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AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Traditionally, these measurements have been categorized into two classes: Conductive AFM (CAFM) , which covers the higher current range (sub-nA up to μA), and Tunneling AFM (TUNA) , which covers the lower current
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Background: Height PeakForce Tapping. Foreground: Height Regular Tapping. Atomic Force Microscopy Webinar: ScanAsyst and PeakForce Tapping Overview PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are AFM imaging modes that will change the way you think about atomic force microscopy. While
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Register Today! - ScanAsyst and PeakForce Tapping Webinar OVERVIEW PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are AFM imaging modes that will change the way you think about atomic force microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the
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The ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
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Additionally, you might want to try dropping the "Engage setpoint" to 0.08V (in the "Other" controls in scan parameter list) and the engage step size to 0.5um (in the general engage parameters). This will help give a softer engage when using stiffer probes with Peak Force Tapping, but you might have problems with false engaging if
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Tony, I don’t think you should have any problem using these probes, and the operation should not change. A key feature of ScanAsyst is its exceptional force control when compared to other modes, and we have found that this force control enables much higher resolution when imaging because tip sharpness can be maintained preserved and better and
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The Atomic Force Microscopy Webinar Series: High-Resolution Imaging and Quantitative Nanomechanical Mapping Using Peak Force Tapping AFM OVERVIEW This webinar will present the principle and applications of Veeco’s revolutionary Peak Force Tapping™ technology, which operates at the sub-resonance frequency of cantilevers and uses the peak