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  • Webinar Video - ScanAsyst and PeakForce Tapping

    PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma
    Posted to Webinars and Video (MediaGallery) by Anonymous on Thu, Mar 24 2011
  • Webinar PDF Slides - ScanAsyst and PeakForce Tapping

    PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma
    Posted to Webinars and Video (MediaGallery) by Anonymous on Thu, Mar 24 2011
  • Re: I need a really HARD AFM tip

    By the probe in question, I suspect you are using TappingMode. I would perhaps approach your problem from a different direction and recommend you scan with Peak Force Tapping. We have found the PFT can image with considerably less tip damage and wear. This is a discussed a bit in this post: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums
    Posted to SPM Digest (Forum) by Stephen Minne on Wed, Mar 23 2011
  • PeakForce TUNA - Simultaneous Electrical and Mechanical Property Mapping

    AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Traditionally, these measurements have been categorized into two classes: Conductive AFM (CAFM) , which covers the higher current range (sub-nA up to μA), and Tunneling AFM (TUNA) , which covers the lower current
    Posted to Application Notes (MediaGallery) by Anonymous on Sat, Mar 12 2011
  • AFM Webinar Series - March 2011: ScanAsyst and PeakForce Tapping

    Background: Height PeakForce Tapping. Foreground: Height Regular Tapping. Atomic Force Microscopy Webinar: ScanAsyst and PeakForce Tapping Overview PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are AFM imaging modes that will change the way you think about atomic force microscopy. While
    Posted to Events (Forum) by Anonymous on Thu, Mar 10 2011
  • Re: Veeco AFM Webinar Series

    Register Today! - ScanAsyst and PeakForce Tapping Webinar OVERVIEW PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are AFM imaging modes that will change the way you think about atomic force microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the
    Posted to Events (Forum) by Anonymous on Thu, Mar 10 2011
  • Introduction to ScanAsyst - Embedded YouTube

    The ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
    Posted to Webinars and Video (MediaGallery) by Stephen Minne on Wed, Mar 9 2011
  • Re: Using high aspect ratio probes

    Additionally, you might want to try dropping the "Engage setpoint" to 0.08V (in the "Other" controls in scan parameter list) and the engage step size to 0.5um (in the general engage parameters). This will help give a softer engage when using stiffer probes with Peak Force Tapping, but you might have problems with false engaging if
    Posted to SPM Digest (Forum) by Bede Pittenger on Thu, Nov 11 2010
  • Re: ScanAsyst with other probes

    Tony, I don’t think you should have any problem using these probes, and the operation should not change. A key feature of ScanAsyst is its exceptional force control when compared to other modes, and we have found that this force control enables much higher resolution when imaging because tip sharpness can be maintained preserved and better and
    Posted to SPM Digest (Forum) by Stephen Minne on Fri, Jun 18 2010
  • Webinar Video - High-Resolution Imaging and Quantitative Nanomechanical Mapping Using Peak Force Tapping AFM

    The Atomic Force Microscopy Webinar Series: High-Resolution Imaging and Quantitative Nanomechanical Mapping Using Peak Force Tapping AFM OVERVIEW This webinar will present the principle and applications of Veeco’s revolutionary Peak Force Tapping™ technology, which operates at the sub-resonance frequency of cantilevers and uses the peak
    Posted to Webinars and Video (MediaGallery) by Anonymous on Thu, May 20 2010
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