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  • Enabling AFM Advancement

    Innovation with Integrity Enabling AFM Advancement April 2013 David Rossi Executive Vice President and General Manager Bruker's AFM Business Topographic map of graphene flake prepared on silicon dioxide, reveals expected 300pm graphene step between successive layers. In the discipline of Tip-Enhanced Raman Spectroscopy (TERS), we continue to introduce
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
  • Continuing the Nanoelectrical Revolution

    Innovation with Integrity Continuing the Nanoelectrical Revolution April 2013 Bruker has a history of innovation and leadership in the area of semiconductor electrical characterization with industry-leading SSRM, SCM, CAFM, and TUNA application modules for Dimension® and MultiMode® and AFM platforms.These techniques have been improved and further
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
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