The Nanoscale World


  • Re: measure yield strength

    Hello Mr Ian, I want to enquire you some questions about AFM. Recently, I measure the modulus of metal thin film which is suspended through Multimode AFM. The red line(retract line) of the force curve is above the red line even though the force is small. Is this normal or if it isn't normal, why? In addition, I use the trigger mode to measure the
    Posted to SPM Digest (Forum) by nanoluna_1231 on Mon, May 9 2016
  • measure yield strength

    Can the AFM measure the yield strength of metal thin film through force curve?How about the break strength?
    Posted to SPM Digest (Forum) by nanoluna_1231 on Wed, Jun 3 2015
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