The Nanoscale World

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  • Looking for Icon crates

    If you bought an Icon and still have/don't need the crates I'm looking to buy them, especially if they are on the east coast. My email is afmservicesllc at gmail dot com, thank you for looking.
    Posted to SPM Digest (Forum) by Anonymous on Tue, Feb 3 2015
  • Re: Force curve shape at high ramp rate, how to interpret the retraction curve?

    Hi Benoit, It appears that the images are still not showing up. Did you try uploading them to your Nanoscaleworld media folder and then use the "insert media" function? Stefan
    Posted to SPM Digest (Forum) by Anonymous on Thu, May 23 2013
  • Re: atomic resolution - tip size

    Hi Luis, Always try to work at the smallest forces possible for atomic resolution. Your biggest enemy are meniscus forces (which are of course not present when sample and tip are immersed in fluid). Having the ability for precise force control is essential for that. Stefan
    Posted to SPM Digest (Forum) by Anonymous on Wed, May 22 2013
  • Re: Moisture concerns for AFM measurements

    Hi Dietmar, Just to clarify: You only need the replaceable cartridge not the whole brush. Inside the cartridge is the strip with the polonium for ionizing the air. A decent photo store should have that. Stefan
    Posted to SPM Digest (Forum) by Anonymous on Thu, May 16 2013
  • Re: Problem with engaging in contact mode

    Hi Mahkalin, Did you actually try if you can properly center the beam on the detector using the mirror? The mirror on your other system might be adjusted slightly different and that is why you get a proper SUM signal. The mirror position is adjusted with the small lever on the back of the AFM head. It is there for that specific reason. If your system
    Posted to SPM Digest (Forum) by Anonymous on Thu, May 16 2013
  • Re: Moisture concerns for AFM measurements

    Hi Dietmar, I would not stop drying my samples. If you image them in ambient conditions however they will be affected by your environment. That is why we offer a glove-box for critical experiments like lithium battery research that requires defined atmosphere. Stefan
    Posted to SPM Digest (Forum) by Anonymous on Wed, May 15 2013
  • Re: Problem with engaging in contact mode

    Hi Mahkalin, You probably picked a soft cantilever that is bending slightly downwards. This can be easily compensated for by moving the beam using the mirror. The adjustment of the mirror is performed using the lever on the back of the MM head. Move the lever slightly to optimize your sum signal. Good luck, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Wed, May 15 2013
  • Re: Moisture concerns for AFM measurements

    Hi Dietmar, It might not be an issue with your samples but its worthwhile keeping in mind. Yes, very dry atmosphere would make the effect more pronounced. Conductive carbon tape helps for sure. for discharging you could use something like this: http://www.company7.com/staticmaster/products/staticmaster.html The insert has a small strip in it that when
    Posted to SPM Digest (Forum) by Anonymous on Wed, May 15 2013
  • Re: Nanoscale Thermal Analysis / Transition Temperature Mapping

    Hi Dietmar, That should work. You will of course give up the advantage of heating only a small area of the sample an not affecting the surroundings. As a quick screening test your planned experiments should suffice. Stefan
    Posted to SPM Digest (Forum) by Anonymous on Wed, May 15 2013
  • Re: Perpendicular converse piezoelectric coefficient (d33) versus applied bias?

    Hi Guys, I'll email you a copy of the Nanoscope V user manual which has the info you are looking for in chapter 3. Following the manual will give you OK data on the Multimode. If however you require better S/N than what you get using the generic method, there is a PiezoResponse option available for the MM8 which uses dedicated signal routing and
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 14 2013
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