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  • Re: Moisture concerns for AFM measurements

    Hi Dietmar, Moisture can have a great influence on the adhesion characteristics, but so can electrostatic charge. I wonder if you see that strong adhesion because your samples are charged. Did you try mounting your samples using conductive stickty taps or similar? Do you use a polonium source or similar above your sample? Stefan
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 14 2013
  • Re: Piezoresponse force microscopy (PFM)

    Hi Don, This is an old internal support document. Stefan
    Posted to SPM Digest (Forum) by Anonymous on Thu, May 9 2013
  • Re: Interpretation of "Deformation value" in Peak Force Tapping at repulsive forces

    Hi Moritz, Lets start with the first part of your question. Bede's Applications note#138 (under "Bruker media" on top of page) has a diagram explaining the various parameters that can get extracted. I am not sure if I understand you correctly but why you think that the tip never contacts the surface? If the tip indeed never contacts the
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 7 2013
  • Re: DLC thin film phase imaging!

    Hi Ranna, I was only asking for the amplitude error channel to see if there was some noise on your system which does not appear to be the case. It might well be that you are wearing your tips rather quickly. Did you try softer tapping or simply scanning a bit slower? The NCHV tips are already pretty sharp and I doubt that a sharper tip will help as
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 7 2013
  • Re: DLC thin film phase imaging!

    Hi Ranna, I am not sure what exactly you expect to see in the phase image of a (nominal) uniform sample? NCHV or TESP are nice tips for Tapping Mode imaging, so nothing wrong here except maybe that I would get the high reflectivity version of those tips next time, NCHVA or TESPA. There is simply not a reason not to for ambient imaging. How does your
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 7 2013
  • Re: Universal bipotensiostat (support note #390)

    Hi Sabya, you will be contacted by our European team to discuss your options. Best, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 7 2013
  • Re: Resolution dependent waviness?

    Hi lgc, Hard to say what the reason is but you may have some low frequency noise coupling into your system that the lock-in used in tapping mode simply filters out. Check that your air table is floating properly and/or active vibration working, that there are no pumps running next to the system. Did you change anything on your system or the room lately
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 7 2013
  • Re: Nanoindentation probe

    Hi Sunil, Are you using the DNISP? The radius is 40nm (nom.) and can be found on the specsheet: https://www.brukerafmprobes.com/Product.aspx?ProductID=3253 Stefan
    Posted to SPM Digest (Forum) by Anonymous on Thu, May 2 2013
  • Re: laser alignment in AFM innova bruker

    Ron, What exactly do you mean by "the laser jumps"? If you use a very soft cantilever and your system is e.g. not properly isolated you may see some movement of the cantilever (as judged by the "moving" laser spot). So first I would make sure that my system is stable. Then I would make sure I am not accidently touching the sample
    Posted to Off-Topic (Forum) by Anonymous on Wed, May 1 2013
  • Dimension Edge and Innova data format

    The question came up again on how to read the *.flt files generated by the Dimension Edge and Innova. Here is a pdf explaining the data structure. Please note that the data are stored in "float" and NOT in "integer". Stefan Data Format.pdf
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 30 2013
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