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  • Re: Lock-in-phase in Surface Potential Detection

    Hi Wilson, I answered your post here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/t/430.aspx Stefan
    Posted to SPM Digest (Forum) by Anonymous on Thu, Apr 25 2013
  • Re: probe questions for EFM/KPFM

    Hi Wilson, Thank you for attending my webinar about AFM applications in the LED world yesterday. KPFM (surface potential) is indeed a quantitative method. That is due to the fact that you use a feedback technique to "null" any difference in potential encountered between tip and surface. Calibration of course, as in any quantitative method
    Posted to SPM Digest (Forum) by Anonymous on Thu, Apr 25 2013
  • Re: atomic resolution - tip size

    Hi Luis, The question is not necessarily how big the tip is but what size of the tip interacts with the surface. E.g. STM tips are often not very sharp but produce nevertheless stunning atomic resolution images on reasonably flat surfaces. The reason is that the exponential distance dependence makes only the front atom interact with the surface. The
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 23 2013
  • Re: Resolution dependent waviness?

    Hi lgc, When you scan the same (or similar) area in Tapping Mode, what do you get? Stefan
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 23 2013
  • Re: New with EFM

    Hi Ali, When you say you get good topographic images but nothing in the phase channel is that related to EFM or do you refer to regular tapping mode? Is your sample mounted so that there is a good electrical connection between tip and sample? What tip are you using? What Lift height are you using? The voltage on the tip will vary depending on sample
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 23 2013
  • Re: Repeating pattern in contact mode

    Hi Solong, The problem you are facing is not uncommon at all for contact mode based electrical measurements. On one hand you would like your interaction forces low enough to preserve the tip and on the other hand you need to ensure a good electrical contact. Furthermore, the metal coatings often used are soft and can wear off rather quickly in certain
    Posted to SPM Digest (Forum) by Anonymous on Thu, Apr 4 2013
  • Re: Problem Regarding SPM software

    Hi Bilal, The Nano Surfaces Division (AFM, optical profilers, stylus profilers) was purchased by Bruker from Veeco. Even though the CP is an older system our customer service engineers are quite familiar with it and will do their best to help you. With kind regards, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Thu, Apr 4 2013
  • Re: Problem Regarding SPM software

    Hi Bilal, Please contact Bruker Technical Support for help: AFMSupport@bruker-nano.com With kind regards, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Wed, Apr 3 2013
  • Re: Repeating pattern in contact mode

    Hi Bilal, You made a good suggestion but it is i) not clear if the setpoint is actually too high and ii) some electrical modes such as conductive AFM might actually require a higher setpoint as you would ordinarily use for simple topographic imaging. Especially semiconductor samples often have a native oxide layer and unless you "push" a bit
    Posted to SPM Digest (Forum) by Anonymous on Wed, Apr 3 2013
  • Re: Problems regarding the TappingMode in liquid

    Hi Wang Shuo, Yes, the c-lever works much better for fluid tapping. Please try the c-lever and let us know the outcome. With kind regards, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Fri, Mar 29 2013
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