The Nanoscale World

Search

  • Webinar Video - Recent progress in AFM/IOM Combination - Highlights on Cancer Research and Neurology

    The Atomic Force Microscopy Webinar Series: Recent progress in AFM/IOM Combination - Highlights on Cancer Research and Neurology OVERVIEW: The ability to combine AFM and optical techniques has become an increasingly critical requirement for advanced biology research, especially in cell imaging. Join us for a free and informative webinar review of the
    Posted to Webinars and Video (MediaGallery) by Anonymous on Thu, May 20 2010
  • Pharmaceutical Webinar - 27 May 2010

    DON'T MISS THIS WEBINAR: Pharmaceutical Applications of the Atomic Force Microscope OVERVIEW For over a decade, atomic force microscopy has been explored as a research tool in the Pharmaceutical Industry. The performed applications are diverse and cover the broad experimental capabilities of AFM. Once a biologically active molecule is selected for
    Posted to AFM Webinar Series Group (Hub) by Anonymous on Thu, May 20 2010
  • Pharmaceutical Applications of the AFM Webinar

    The Atomic Force Microscopy Webinar Series: Pharmaceutical Applications of the Atomic Force Microscope OVERVIEW For over a decade, atomic force microscopy has been explored as a research tool in the Pharmaceutical Industry. The performed applications are diverse and cover the broad experimental capabilities of AFM. Once a biologically active molecule
    Posted to AFM Webinar Series Group (Hub) by Anonymous on Thu, May 20 2010
  • Pharmaceutical Applications of the Atomic Force Microscope

    The Atomic Force Microscopy Webinar Series: Pharmaceutical Applications of the Atomic Force Microscope OVERVIEW For over a decade, atomic force microscopy has been explored as a research tool in the Pharmaceutical Industry. The performed applications are diverse and cover the broad experimental capabilities of AFM. Once a biologically active molecule
    Posted to Events (Forum) by Anonymous on Thu, May 20 2010
  • Webinar Video - A First In-Depth Look at the New Dimension Edge AFM System and its Applications

    The Atomic Force Microscopy Webinar Series - Recording: A First In-Depth Look at the New Dimension® Edge™ AFM System and its Applications Overview Learn all about the new Dimension Edge Atomic Force Microscope (AFM) Closed-Loop system and its applications. The Dimension Edge leverages many Veeco innovations to provide solid performance in
    Posted to Webinars and Video (MediaGallery) by Anonymous on Wed, May 19 2010
  • Webinar PDF Slides - An Introduction to CD Metrology in the Semiconductor Industry

    The AFM Webinar Series - PDF Slides: An Introduction to CD Metrology in the Semiconductor Industry OVERVIEW As evidenced at SPIE Advanced Lithography 2010, reference metrology has been identified as a key enabler for driving Moore’s law at the 45nm node and beyond. CD-AFM is rapidly being established as the requisite Reference Metrology System
    Posted to Webinars and Video (MediaGallery) by Anonymous on Tue, May 18 2010
  • Webinar Video - An Introduction to CD Metrology in the Semiconductor Industry

    The AFM Webinar Series: An Introduction to CD Metrology in the Semiconductor Industry OVERVIEW As evidenced at SPIE Advanced Lithography 2010, reference metrology has been identified as a key enabler for driving Moore’s law at the 45nm node and beyond. CD-AFM is rapidly being established as the requisite Reference Metrology System (RMS) for inline
    Posted to Webinars and Video (MediaGallery) by Anonymous on Tue, May 18 2010
  • Re: AFM and TERS

    I think Thomas wrote a nice long answer. The short answer is that: i) it is indeed a great idea and the subject of ongoing research for the last 10 or so years and ii) vastly more flexible than combining STM with Raman due to the known issues of requiring a conductive sample. The simple reason for using STM is in my opinion due to the fact that STM
    Posted to SPM Digest (Forum) by Anonymous on Fri, May 14 2010
  • Re: Imaging DNA in liquid

    At what frequency did you attempt to excite the c-levers?
    Posted to SPM Digest (Forum) by Anonymous on Fri, May 14 2010
  • Have YOUR News Posted Here

    The Nanoscale World has been growing rapidly and we want to make it the best resource it can be for you. WHY YOU SHOULD POST YOUR NEWS HERE By posting your news here you will connect and share it with hundreds of members that share your enthusiasm for metrology and nanoscience (not to mention the thousands of other visitors). HOW TO POST YOUR NEWS HERE
    Posted to News (Forum) by Anonymous on Fri, May 7 2010
Page 57 of 63 (629 items) « First ... < Previous 55 56 57 58 59 Next > ... Last » | More Search Options
Copyright (c) 2011 Bruker Instruments