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  • Have YOUR Event Posted Here

    The Nanoscale World Community has been growing rapidly and we want to make it the best resource it can be for you. WHY YOU SHOULD POST YOUR EVENT HERE When you post your events in this forum section, you will be able to connect and share information with hundreds of fellow Nanoscale World Community members (and thousands of other visitors). HOW TO POST
    Posted to Events (Forum) by Anonymous on Fri, May 7 2010
  • Veeco talk at Microscience 2010 / UK SPM 2010

    We are pleased to let you know that the below abstract by Veeco's R&D team has been accepted for a talk at the Microscience / UK-SPM 2010 meeting in London. I look forward to seeing you at the meeting! Real time interaction force analysis enables quantitative nanomechanical imaging Johannes H Kindt, Chanmin Q Su, Shuiqing Hu, Bede Pittenger
    Posted to Events (Forum) by Anonymous on Fri, May 7 2010
  • Have you JOB POSTED here.

    Welcome to our Jobs & Internships Forum, be sure to check for new opportunities with the World Leader in Metrology. The Nanoscale World has been growing rapidly and we want to make it the best resource it can be for you. WHY YOU SHOULD POST YOUR JOB OR INTERNSHIP HERE By posting your jobs or internships here you will connect and share it with hundreds
    Posted to Jobs and Internships (Forum) by Anonymous on Mon, May 3 2010
  • Re: Detrend function in NS5.31r1? What does it do?

    Chen, I am a software engineer at Veeco Instruments and would like to assist you with your recent question about the Detrend analysis in v5.31r1. First, I should clarify that this is not a tip dilation or deconvolution analysis. In fact there is no tip deconvolution analysis in our Instrumentation software although you could perhaps use the rolling
    Posted to SPM Digest (Forum) by Anonymous on Wed, Apr 28 2010
  • Veeco AFM Webinar Series Archive

    Veeco Atomic Force Microscopy Webinar Series - Archive Missed a Veeco Atmoic Force Microscopy webinar? Want to review a few key moments in detail? Veeco has you covered. Our archive of the AFM webinar series will help you make up lost time on the subjects that interest you and it is as simple as filling out a form and registering for the title. That's
    Posted to Events (Forum) by Anonymous on Thu, Apr 8 2010
  • Peak Force QNM - calibration

    Is the calibration step different from HarmoniX? What are the main steps?
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 6 2010
  • Peak Force QNM - Probe choice

    What are the existing probes and for which type of applications (samples) would you recommend them?
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 6 2010
  • Peak force QNM

    Is there any way to modify the maximum amplitude of oscillations?
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 6 2010
  • Peak Force QNM - operation in liquid

    When operating in liquid, can you use the regular PFQNM parameters or do you have to change something?
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 6 2010
  • Re: Sample thickness limitations for PeakForce QNM

    With regular force volume, you were clearly dependent on the 200-300 nm below the probe (whatever the trigger treshold you selected). With HarmoniX, the influence of the underlying substrate was not so obvious (it was reduced to a few tens of nanometers). With peak Force QNM, it's in theory a couple of nanometers. The best test would be to image
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 6 2010
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