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  • Re: Water purity and nanoparticles on Mica

    Don, I think you would find that the gas humidity will not increase substantially with just one pass through a simple gas bubbler. So it will still be suitable for drying a sample. I should have made that point more explicitly. It's why I mentioned that additional effort is required in this sort of configuration if you do want to introduce substantial
    Posted to SPM Digest (Forum) by Ben Ohler on Wed, Jan 23 2013
  • Re: Water purity and nanoparticles on Mica

    I think "bubble trap" probably refers to something like this: http://en.wikipedia.org/wiki/Gas_bubbler where the idea is that particulates get stripped from the gas as it passes through water in the bubbler. I did this years ago to try to get a humidified gas stream. That took some extra effort to increase the gas-liquid contact area and contact
    Posted to SPM Digest (Forum) by Ben Ohler on Wed, Jan 23 2013
  • Re: Contolling penetration depth OR maximum force on tips in Ramp mode?

    The non-contact value in the baseline region of force curves is arbitrary. It depends on how you have adjusted your vertical deflection signal. Actually, since it is normally "deflection error" it will be the raw deflection signal minus the deflection setpoint. All forces in the curve must be measured relative to the baseline force, which
    Posted to SPM Digest (Forum) by Ben Ohler on Mon, Dec 3 2012
  • Re: Nanolithography using Nanoscope V

    Yes, Point and Shoot might work. There should be a parameter in ramp mode under the "Mode" group called "XY move on surface." If enabled, it should move the tip in feedback from one Point and Shoot location to another. I'm not sure, however, if this motion is a straight line or two orthogonal steps. -Ben
    Posted to SPM Digest (Forum) by Ben Ohler on Mon, Dec 3 2012
  • Re: HarmoniX and Adaptive Scan

    Alex, I think this should be possible, though I can't be sure that it's a use case that's been tested since Adaptive Scan was introduced at the same time as PeakForce QNM. If you try it and find otherwise, please let me know. -Ben
    Posted to SPM Digest (Forum) by Ben Ohler on Fri, Nov 30 2012
  • Re: Nanolithography using Nanoscope V

    If you don't mind a fully manual procedure, then you could just use the XY offset parameters to move the tip in a square pattern while the scan size is set at 0. The offsets move in feedback. So if you engage in contact mode with zero scan size, adjust the setpoint to a high enough force that you will scratch, and then adjust the offsets appropriately
    Posted to SPM Digest (Forum) by Ben Ohler on Fri, Nov 30 2012
  • Re: Contolling penetration depth OR maximum force on tips in Ramp mode?

    You can use a "relative trigger" on the deflection signal to control the maximum tip-sample force in a ramp mode force-distance curve. For instance, if you set a relative trigger of 1nN, you will find that the force curve extends until the force reached 1nN and then retracts from that point. I know it seems overconstrained by the ramp size
    Posted to SPM Digest (Forum) by Ben Ohler on Fri, Nov 30 2012
  • Re: Question about MIRO

    Alex, The five ROI limit is intentional. Apparently these are memory intensive. Remember though that the ROI settings are saved when you save the MIRO canvas. So you can always save your current ROI settings, then modify and save again under a different filename. You don't need to recreate anything. Also remember that you can have up to 8 layers
    Posted to SPM Digest (Forum) by Ben Ohler on Fri, Nov 30 2012
  • Re: Lateral force sensitivity

    This paper is a good review of the options for both lateral deflection sensitivity and lateral spring constant: Torbjörn Pettersson, Niklas Nordgren, Mark W. Rutland, and Adam Feiler. "Comparison of different methods to calibrate torsional spring constant andphotodetector for atomic force microscopy friction measurements in air and liquid
    Posted to SPM Digest (Forum) by Ben Ohler on Wed, Nov 28 2012
  • Re: Nanoscope Analysis Software - Slow data saving?

    Jerry, Please be sure you are using the latest NanoScope Analysis version (see here ). I think I remember an export bug being fixed back a version or two ago. Also be sure to check the new Export feature under the Analysis menu. I'm assuming here that you are using the old right-click export functionality. The new Export feature offers a lot more
    Posted to SPM Digest (Forum) by Ben Ohler on Wed, Nov 28 2012
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