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Hi Jason, Are you planning on using PicoForce scripting or do you already have one of our scripting packages like lithoscript or nanoscript? What channel do you want to ramp? The Z piezo position? Do you need to collect data during the ramp or only between ramps? --Bede
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The calibration procedure is based on this paper by Ozgur: O. Sahin, "Harnessing Bifurcations in Tapping-Mode Atomic Force Microscopy to Calibrate Time-Varying Tip-Sample Force Measurements", Rev. Sci. Inst. 78 (2007) 103707. In addition there are a few tweaks to adjust for scaling factors that our software introduces. While there are many
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Sure, just open the file in a text editor (notepad, notepad+, sciTE, etc.) and search for "lockin". You will find many parameters. Also, you will note that many of the parameters are repeated twice. The first one is for the main line and the second is for the interleave/lift line if you are using interleave or lift mode. --Bede
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Ben and Pete have covered the situation pretty well, but here is a summary. To get the ultimate resolution you should: 1. Set the scan size and number of pixels so that they do not limit the resolution 2. Minimize the interaction region by using a sharp probe (small end radius) and small sample deformation (by using the smallest peak/trigger force possible
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The key is to get the calibration parms for the measurement conditions. If the coating will not effect the spring constant or tip end radius, you can do the calibration of those parms prior to coating. You cannot pre calibrate the deflection sensitivity since that depends on the laser alignment. In fact, you should do that measurement just before your
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SNL-10 probes should work fine for imaging photoresist in contact mode or for doing adhesion maps in force volume mode. It is likely that the photoresist is too stiff to get good elasticity information with those probes, however. You should give it a try, but I suspect you will not have much deformation of the sample. Peak Force Tapping gives you significantly
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Thanks for your input. I'll add it to the list! --Bede
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Which function in Gwyddion are you using? We plan to make Nanoscope Analysis better over time... --Bede
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Nanoscope Analysis has three functions that can help with this issue (and they all alter your data set, so be careful): 1. Flatten can set adjacent scan lines to match in value or slope. Thresholding and exclusion boxes can help identify areas of good data. 2. Erase allows users to select lines or boxes to be replaced by the average of data above and
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Can you provide a little more detail about your configuration? 1. What kind of probe are you tuning? What spring constant and resonant frequency? 2. What type of system? PicoForce or Dimension With hybrid head? --Bede