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That usually means that something is wrong with the setup. For example, the sample may not be fixed well to the sample chuck or there is a problem with the tip or holder, or there has been a very large temperature change. To debug, I would go back to your calibration standard and install a new probe. If that works, the problem most likely lies with
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I am able to reproduce the problem, but the only workaround I can find is to change the screen resolution to a different value. Apparently the behavior of the layout depends on screen resolution. I will report this and see about getting it fixed for the next version. Thanks for reporting the problem. --Bede
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Hi Fangfang, I would recommend precalibrating the spring constant in air since the thermal tune method does not work as well in fluid. After doing this, you MUST do the deflection sensitivity calibration in fluid since it will be significantly different from the deflection sensitivity in air. If the deflection sensitivity is not the problem (as Ang
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Can you tell us the resolution of the 24" monitor? You should be able to find this by rightclicking on the desktop and choosing "screen resolution". Once we have that information, we should be able to repeat your problem and see if we can find a workaround until we can fix it... --Bede
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It is nearly the same (maybe mathematically equivalent up to roundoff?). The Offline planefit divides the image into four quadrants, calculates the average value for each quadrant, and subtracts the plane that intersects the four average values. --Bede
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If you are looking to make the color bar relative, you can do that by right clicking on the color bar, choose modify data scale and check the "Color bar scale relative to minimum data cursor" box. If you really want to change the data to make it offset by a constant, you can use the "Image Math" function to add or subtract a constant
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The PS film is deposited on Silicon. The thickness is not controlled very accurately since it is spin-cast. I think it is typically 100-500nm thick. You can test this using a razor blade to make a scratch and then imaging the area with the AFM. The thickness will vary a bit over the sample area, so you might want to try a few spots. --Bede
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Hi Wilson, There is no way that the PS could have aged that much. Either there is a problem with the measurement, or your sample is not PS, or the PS is so thin that the nanoindenter is feeling the substrate. Can you scratch the sample with the AFM probe using nanoman or contact mode? The absolute method can work over a similar range to the relative
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Hi Janne, If you like, the vertical ('Deflection Error') and lateral ('Friction') can be sent out through "Output 1" and "Output 2" ports on the front panel of the NSV in contact mode. The outputs are updated at 100KHz, so they are not good for very fast signals, but they might be enough. It isn't really that
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Hi Janne, We do not currently support acquisition of more than one channel at a time in Force Volume. You can trigger on a second data type (i.e. you could collect the first image of vertical deflection with triggering on vertical deflection and then collect a second image of lateral deflection with triggering on vertical deflection). A second option