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  • Re: viscoelasticity measurements via multimode AFM

    Philippe, It sounds like you have some concerns about Ozgur’s paper, and I can only recommend you give him a call to discuss his work; he is very engaging and always excited to talk about his research. I should mention, Nature is renowned for its quality and thorough peer review. The information in Figure 5 in the Peak Force Tapping application
    Posted to SPM Digest (Forum) by Stephen Minne on Tue, Jul 6 2010
  • NanoLithography Support Note 316, Revision A

    This support note details NanoLithography theory, NanoScript™ syntax for performing lithography commands and procedures to test, build and run NanoLithography programs. Refer to the following sections for using your NanoLithography Package: New NanoLithography Package: Section 316.2 on Page 2 Package Contents: Section 316.2.1 on Page 2 Terms and
    Posted to Other (MediaGallery) by Stephen Minne on Tue, Jul 6 2010
  • HarmoniXTM Microscopy for Materials Characterization

    By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy that extends these advantages even further, enabling higher resolution at higher speed while retaining the nondestructive, low-force qualities that make TappingMode AFM so popular. While contact mode force curves are typically easier to interpret than
    Posted to Application Notes (MediaGallery) by Stephen Minne on Tue, Jul 6 2010
  • Re: viscoelasticity measurements via multimode AFM

    I am well Philippe. Thanks for your note and good to hear from you again. I hope all is well with you. Agreed, the figure is a schematic and as such makes it the trade off between detail and simplicity. To address your questions let me refer you to the Application Note on Peak Force QNM. Quantitative Mechanical Property Mapping at the Nanoscale with
    Posted to SPM Digest (Forum) by Stephen Minne on Fri, Jul 2 2010
  • Re: viscoelasticity measurements via multimode AFM

    I don’t have any papers on this, but believe it is a daunting task to try to extract viscoelasticity from Tapping or Phase. This is challenging because the phase signal is a non-linear function of set point but more so because the phase signal is the mix of multiple sample interaction contributions including viscoelasticity but also plasticity
    Posted to SPM Digest (Forum) by Stephen Minne on Thu, Jul 1 2010
  • Re: ScanAsyst with other probes

    Tony, I don’t think you should have any problem using these probes, and the operation should not change. A key feature of ScanAsyst is its exceptional force control when compared to other modes, and we have found that this force control enables much higher resolution when imaging because tip sharpness can be maintained preserved and better and
    Posted to SPM Digest (Forum) by Stephen Minne on Fri, Jun 18 2010
  • Re: how to clean the raster sample

    Just learned about this product from Photonic Cleaning Technology today ( http://www.photoniccleaning.com/ ) Natalia cleaned this very dirty grating in about 15min. Optical images below: Before: After:
    Posted to SPM Digest (Forum) by Stephen Minne on Thu, Jun 10 2010
  • Re: Pharmaceutical Applications of the Atomic Force Microscope

    FINAL REMINDER: Pharmaceutical Applications of the Atomic Force Microscope ONLY ONE LIVE BROADCAST - REGISTER TODAY! Thursday, May 27, 2010 Click Here to Register -> 8:30am PDT (11:30am EDT)
    Posted to Events (Forum) by Stephen Minne on Wed, May 26 2010
  • Re: AFM and TERS

    Also check Laurent Kerplak's lab at Dalhousie University who is also working on this topic. His home page has a picture of an integrated system. http://fizz.phys.dal.ca/~kreplak/
    Posted to SPM Digest (Forum) by Stephen Minne on Thu, May 20 2010
  • Re: EFM Sample - Picture request

    Cuong, I am seeing it. It is an external link so it may take a moment to download. Reply if it doesn't show up and I bet Thomas will email it to you, Steve
    Posted to SPM Digest (Forum) by Stephen Minne on Thu, May 20 2010
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