-
Mickaël did interesting demo for Bordeaux prospect. He obtained high resolution data in liquid over floating polymer chain on top of mica. The polymer chains form SAM layer on top of grafted molecules on mica. The key conclusions are: - ScanAsyst instantly showed great resolution (100 nm scan size) in easy way compared to what user was able to
-
The MultiMode® is the world’s most field-proven scanning probe microscope (SPM), with thousands of systems installed worldwide. Its success is based on its superior resolution and performance, its unparalleled versatility, and its proven record of productivity and reliability. Now, the MultiMode 8, featuring Veeco’s proprietary ScanAsyst™
-
The MultiMode® is the world’s most field-proven scanning probe microscope (SPM), with thousands of systems installed worldwide. Its success is based on its superior resolution and performance, its unparalleled versatility, and its proven record of productivity and reliability. Now, the MultiMode 8, featuring Veeco’s proprietary ScanAsyst™
-
ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
-
ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
-
PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
-
PeakForceTM QNMTM is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high
-
PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce
-
-
ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter