The Nanoscale World


  • Dimension FastScan Brochure

    Posted to Brochures & Data Sheets (MediaGallery) by Hector Lara on Mon, May 2 2011
  • Dimension FastScan

    Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible with other commercial AFM systems. It is simply
    Posted to SPM Digest (Forum) by Hector Lara on Mon, May 2 2011
  • Re: trouble in Icon

    Fangfang, One of our applications engineers will be addressing your question regarding the calibration parameters mismatch, in th emeantime, please send the data image to my email address with any questions you may have and I will make sure you get your answers. Thank you, Hector Lara Sr. Product Manager AFM Metrology
    Posted to SPM Digest (Forum) by Hector Lara on Tue, Jun 1 2010
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