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*** Copied from LinkedIn Posting *** I was wondering could it be possible that conventional tapping mode in liquid can achieve similar resolution. Since you are using a standard cantilever, the overall dynamics didn't change, so you lowered the noises at all levels? What have changed so that you can have higher resolution than tapping mode, stiffness
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Why is a default value of 85% assigned to the fit region of Deformation? The manual (p.28, PeakForce User Guide) says: “This parameter is used to reduce the effect of baseline noise.” What I was originally interested is to know whether this parameter (Deformation Fit Region) would affect the DMT Modulus calculation. It appears that it doesn’t
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Q: Is it possible to scan below 0.1Hz in NanoScope A: Yes, this is a user selectable setting, however, whenever in a manual mode (ie not ScanAsyst) you will not be able to adjust parameters within a scan line (ie 100s for a 0.01 scan); ScanAsyst will autoupdate within a line. To change the limit, adjust the "minimum scan rate" parameter in
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Support Question Forward: We would like to ask some information about the surface potential measurements by using our Veeco D3100. Recently we have been applying KPFM to differenciate p-n junction with dosage difference of 5 order of magnitude. And the measured potential difference is near 20 mV. If the dosage difference is further decreased to 2 order
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Welcome to all the new Nanoscale World Members and Happy Friday! What's everyone scanning today?
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I was wondering if it was possible to carry out solvent vapor annealing experiments in situ with the AFM. I don't know if we can do such experiments without damaging the electronics parts of the microscope. We have the Veeco temperature controller system. Solvents that we'd like to use are THF and choloroform.
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I am using carbon nanotube AFM probe for high resolution AFM imaging of inorganic thin film material. But the carbon nanutube AFM probe is apt to break while approaching the sample surface before the imaging process begin. May be the carbon nanotube AFM probe is fragile comparing with silicon/SiN AFM tips. Does anyone has some experience to solve this
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>> I am a user with a Dimension 3100 AFM with a Nanoscope 4 controller.I have a controller software 5.31r1 version. >> I noticed that in modify menu there is a detrend function. I want to know what operation did it work? is that a dilation for tip? I can show two papers talking about the popular methods to detrend the data. one is FFT base
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Isn't PeakForce Tapping the same as "jump" mode or Pulsed Force Mode?
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It is commonly accepted that Li-ion battery life is limited by the process of degradation of electrode materials with repeated charging and discharging. During battery operation, lithium ions are shuttled between cathode and anode when the battery is being charged and discharged. One of the degradation mechanisms is related to the development of internal