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Dimension Hybrid XYZ Video
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Fast-Scanning with the NanoScope IV SPM Controller and TappingMode+™ - Textured Hard Disk Fast-scanning is the new ability to scan a sample at speeds up to 10 times faster than possible with conventional AFM/SPM systems. This translates to complete scans in seconds vs. minutes while maintaining integrity and accuracy. The movies below show conventional
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Fast-Scanning with the NanoScope IV SPM Controller and TappingMode+™ - Textured Hard Disk Fast-scanning is the new ability to scan a sample at speeds up to 10 times faster than possible with conventional AFM /SPM systems. This translates to complete scans in seconds vs. minutes while maintaining integrity and accuracy. The movies below show conventional
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Syndiotactic Polypropylene s-PP: 130 degrees C, 40µm scan Crystallization in 14 hours. Syndiotactic Polypropylene s-PP: 125 degrees C, 40µm scan Crystallization in 3 hours. Syndiotactic Polypropylene s-PP: 120 degrees C, 40µm scan Crystallization in Less than 1 Hours. Syndiotactic Polypropylene s-PP: 120 degrees
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Animation of TappingMode Scanning on Epitaxial Silicon. Atomic Steps are 1.4 Angstroms high. TappingMode Scanning in Quicktime TappingMode Scanning in Windows Media Player
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Many of the biological samples suitable for imaging with atomic force microscopy (AFM) are subject to artifacts if they are dried. This problem is not unique to AFM imaging. It has long been a concern in electron microscopy and methods have been developed to minimize its effect with that imaging technique (namely fixation, critical point drying, and
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Atomic force microscopy (AFM) has opened exciting new avenues in microbiology and biophysics for probing microbial cells. The unprecedented capabilities of AFM can be summarized as follows: i) imaging surface topography with nanometer lateral resolution and under physiological conditions; ii) measuring local physical properties such as adhesion forces
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AFM has contributed to ground-breaking research in the investigation of DNA, proteins, and cells in biological studies; structure and component distribution in polymer science; piconewton force interactions and surfactant behavior in colloid science; and physical/ mechanical properties and fabrication variables in the material sciences. Pharmaceutical
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Veeco Metrology Group, through its Digital Instruments and TM Microscopes divisions, offers several lines of scanning probe microscopes (SPM) capable of atomic force microscopy (AFM). Large sample stage AFMs can handle full-size MEMS wafers, and offer a range of automation options for the production fab. Small sample stage AFMs, with fewer automation
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Microscopic evaluation is important for the design and evaluation of a pharmaceutical product after the steps in the drug formulation process. Since atomic force microscopy (AFM) provides the ability to directly investigate surface structure at nanometer-to-subangstrom resolution in ambient and liquid environments, it has been applied to a wide range