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  • Re: Why ´Bias´ changes the slope of ´Potential´Scope in Surface Potential Detection?

    Realtime Planefit- Offset would not remove the tilt. Can you take a screenshot and send to me. chunzeng.li@bruker-nano.com Thanks Chunzeng
    Posted to SPM Digest (Forum) by Chunzeng Li on Fri, Jul 6 2012
  • Re: Why ´Bias´ changes the slope of ´Potential´Scope in Surface Potential Detection?

    I suppose you have tried on the sample chuck (D3100 stage) to see whether the measured potential follows the change in Bias. This is a quick way to verisfy whether the system is set up properly. Once you have done this, you can move on to your sample. For surface potential measurement, a reliable electrical connection to the sample is required; simply
    Posted to SPM Digest (Forum) by Chunzeng Li on Wed, Jun 20 2012
  • Re: Nanoscope E controller

    Hi Isma, Z-mod was designated for NanoscopeIII/IIIa controller (an more advanced model vs Nannoscope E); in other word, it was intended to be disabled on Nanoscope E. Apparently, it ended up on one of your Nanoscope E controllers by mistake or luck in the handling process. Or maybe that E controller was upgraded to NSIII at a later point but with the
    Posted to SPM Digest (Forum) by Chunzeng Li on Wed, Jan 4 2012
  • Re: Expected z-sensor ramp response PFM

    Dear Adrian, Using ramping mode to determine d33 is not the preferred way, I recommend you use the Piezoresponse Mode. Below is what why I think you are not getting what you expect with ramping: You should not set gains to zero if you want z-piezo, thus z-sensor, to follow the mechanical response to the applied DC voltage. The expected z_sensor should
    Posted to SPM Digest (Forum) by Chunzeng Li on Mon, Nov 21 2011
  • Re: surface potential

    Dear Fangfang, Let me answer your first question: I recommned SCM-PIT probe, it has Pt-Ir coating which has a well defined workfunction. Regarding the procedure, you can find it in the built-in help. Launch Nanoscope (realtime), got to Help->Nanoscope Help, and search for "Surface Potential Dedection Procedure", where it outlines the steps
    Posted to SPM Digest (Forum) by Chunzeng Li on Fri, Nov 18 2011
  • Re: Dimension Icon STM tip keeps crashing

    Can you please check: use a volt-meter to check whether bias is present on the sample, with 1 probe on the sample, one probe on the piezo gaurd of the AFM head. It should read the same as bias set in the software. make sure STM tip is more than 1mm away from the surface. If the above does not solve the problem, please take a screenshot of the error
    Posted to SPM Digest (Forum) by Chunzeng Li on Wed, Nov 2 2011
  • Re: Information on STS ramp

    Dear Dinushi, Let me first explain the parameters so to establish a base as what settings we should be using for STS i(V). Feedback Type F EEDBACK TYPE , selected from a pull-down list, is used to control the tip-to-sample separation and helps avoid tip crashes that can be caused by drift. For each feedback type, feedback is on for the duration specified
    Posted to SPM Digest (Forum) by Chunzeng Li on Fri, Sep 9 2011
  • Re: IV plotting:CAFM

    Hi Sandeep, Sorry for the delay. My email is: chunzeng.li@bruker-nano.com . Chunzeng
    Posted to SPM Digest (Forum) by Chunzeng Li on Fri, Sep 9 2011
  • Re: IV plotting:CAFM

    Hi Sandeep, Is it possible that you send me the source code and the .dll, so we can try out. Thanks Chunzeng
    Posted to SPM Digest (Forum) by Chunzeng Li on Thu, Aug 18 2011
  • Re: IV plotting:CAFM

    Hi Sandeep, I recall there was a problem doing ramping (for instance I-V curves) in Point&Shoot mode or Array mode in v720, which was fixed in v730. Can you elaborate what kind of problems you have with v730 on lithography? It is easier for us to fix a problem in the latest version; than go back to fix an old version (we do not usu do this). Thanks
    Posted to SPM Digest (Forum) by Chunzeng Li on Mon, Jul 25 2011
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