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  • Re: Need Help with Multimode SCM in Open Loop and Closed Loop

    Dear Rafel, First, there has not been a convention to follow as whether to use negative phase to denote P type and positive phase for N type. I'm perfectly fine with, actually prefer to using Positive phase of P-type and Negative phase for N-type. It is improtant however to keep consistent among the data you collect whichever denotion you choose
    Posted to SPM Digest (Forum) by Chunzeng Li on Wed, Dec 1 2010
  • Re: probe questions for EFM/KPFM

    Platinum–iridium alloy of platinum containing from 1 to 30 percent iridium , used for jewelry and surgical pins. A readily worked alloy , platinum– iridium is much harder, stiffer, and more resistant to chemicals than pure platinum, which is relatively soft. Platinum–iridium is also very resistant to high-temperature electric sparks
    Posted to SPM Digest (Forum) by Chunzeng Li on Thu, Jul 15 2010
  • Single pass EFM / surface potential with Nanoscope V

    This Support Note describes a procedure to take electric force and surface potential measurements simultaneously with topography scanning - the so called single pass technique .
    Posted to Application Notes (MediaGallery) by Chunzeng Li on Tue, Jul 6 2010
  • Re: multiple channels in electrochemical (EC) mode?

    Dear Nick, In EC mode, there is only one image channel in version 8.10 or earlier versions. We are working to expand to 6-channels, stay tuned. Regards Chunzeng
    Posted to SPM Digest (Forum) by Chunzeng Li on Tue, Jun 15 2010
  • Re: sample workfunction

    Dear Alberto, The procedure you outlined is perfectly fine. The simpler way yet is to use a tip that has a known and well defined workfunction, for example, Pt-coated tip (such as OSCM-PT from Veeco Probes ). Let the tip assume the workfunction of Pt ~5.5V , then the workfunction of the sample is simply 5.5V- surface potential (contact potential difference
    Posted to SPM Digest (Forum) by Chunzeng Li on Tue, Jun 8 2010
  • Re: Liquid cell O rings compatibility

    Hi Nikos, Please consult the chemical compatibility list at http://www.veeco.com/nanoscaleworld/media/p/580.aspx . The data are collected from different sources, the O-rings are tested only on a limited number of solvents at Veeco. Chunzeng
    Posted to SPM Digest (Forum) by Chunzeng Li on Fri, Jun 4 2010
  • Chemical Compatibility List

    This table is a compilation of chemical compatibilities of a quite comprehensive list of chemicals with different components of the AFM.
    Posted to Brochures & Data Sheets (MediaGallery) by Chunzeng Li on Fri, Jun 4 2010
  • Re: Solvent Compatibility

    Both THF (tetrahydrofuran) and cholorform are strong organc solvents, the vapors of which can soften expoxy used in AFM head / scanner assemblies, and can also cause humid-resistant coatings on the scan piezo to swell and peel. So it is an absoultely no no to do in-situ vapor annealing. With this said, confined liquid imaging in room temperature can
    Posted to SPM Digest (Forum) by Chunzeng Li on Thu, May 6 2010
  • Re: Oxidation of Tungssten STM probes

    I would say Tungsten tips can stay usable for hours – typically people make Tungsten probes the same day they use them, and experiments last hours during which the tip must stay in working condition. The oxide can eventually stop current from flowing (when for instance thicker than 1nm, but I don’t know how long it takes to form such thickness
    Posted to SPM Digest (Forum) by Chunzeng Li on Wed, Mar 24 2010
  • Oxidation of Tungssten STM probes

    I had a converstation with a customer using tungsten STM probes. They had a few questions regarding the oxidation probes that I was hoping you could help me with: In your experience, how quickly do tungstem STM tips oxidize? Minutes? Hours? Days? How critical is the oxidation towards the performance of the scan? Is there a way to eliminate the oxidation
    Posted to SPM Digest (Forum) by Chunzeng Li on Wed, Mar 24 2010
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