-
Hi Saumil, The behavior that you are describing definitely seems odd. It looks as if the closed loop is either not working, or it is behaving like it is in open loop. So, I have a few questions for you: - I am assuming that you are using a closed loop scanner (Hybrid, or XY closed loop). Is this correct? - Is the XY Closed Loop parameter set to "On"
-
Hi Dalia, It would be fine to use the OTESPA probes instead of the RTESPA probes. For probes this stiff, I would use the relative calibration method, so I don't think the difference in probe will make a big difference. I hope this helps. John
-
Hi Ang I would recommend calibrating the deflection senstivity on the sapphire sample if you want it to be accurate. Deflection senstivity will change with your laser position on the back of the cantilever, so every time you adjust the laser, you will need to calibrate this if you want to measure the correct cantilever deflection in nanometers on the
-
Hi Alex, Yes, you can definitely image cells with the Dimension V. It would be good to know a little more detail about the problems that the student is having. However, I can provide some general guidelines below that may answer their question. You can image the cells in contact or TappingMode in fluid with the Dimension V. You would choose similar
-
Hi Dalia, I can answer some of your questions. 1 - The stainless steel cantilevers have a small "mirror" mounted to the backside of the cantilever near the free end. For this reason, you will get a good reflection and this would serve the same function as the Al coating on the other probes. You should be able to see this mirror optically.
-
Hi Fangfang, The way I like to write oxide lines is to image in TappingMode with a probe like the SCM-PIT or MESP and switch my feedback to Contact for the oxidation. I prefer to do this in the Path tab instead of Manual. Set the Deflection Setpoint to be slightly above the free air deflection. So, on the ICON, press the button on the LCD display (for
-
Hi Josep, Can you describe the series of steps that you are using to go between TappingMode imaging to contact mode force curves? Are you going into Ramp and changing the Trigger to TMDeflection? Are you withdrawing and switching the feedback to contact mode and re-engaging? Can you provide some more details of how you are setting the parameters? As
-
Hi Fenny Determining whether to apply a planefit really depends on your sample and what you are trying to measure. You mention both roughness and modulus values in your question. When you refer to Modulus, if you are referring to the DMT Modulus channel in PeakForce QNM, then you would not want to apply a planefit. The "Z" value of the DMT
-
PFM can be performed on wide band gap materials, but generally you will want a conductive path from the sample stage to this material. So, often this type of material will be deposited on a bottom electrode for PFM. In your case, if you have an insulating substrate, then you could use silver paint or conductive tape (carbon, copper, ...) to form a conductive
-
Hi Chris, I think you will find that many of NanoScope Analysis software routines that you are referring to (flatten, roughness,…) have enough similarities to versions 4 and 5 that you will pick up the new software quickly. As Ang mentioned, you can always use the Help (hit F1 or go to the Help pull down menu) to find instructions for the software