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  • PeakForce TUNA Datasheet

    2-page datasheet showcasing the unique benefits of PeakForce TUNA for obtaining the highest resolution conductivity data along with correlated nanomechanical information, on the most fragile samples, including OPVs, Lithium battery electrodes, and carbon nanotube structures.
    Posted to Brochures & Data Sheets (MediaGallery) by Thomas Mueller on Wed, Aug 24 2011
  • Re: Autoprobe Questions

    Hi Crimsonhen, It is a question of working on the right side of the peak (for noncontact) vs the left side of the peak (for tapping). To be more precise, in what is sometimes referred to as non-contact mode in ambient conditions, the drive frequency is set on the right side of the peak at a location where the amplitude has decreased by some fraction
    Posted to SPM Digest (Forum) by Thomas Mueller on Wed, Jan 5 2011
  • Re: sample workfunction

    Hi Alberto, Yes, Kelvin probe microscopy can tell you differences in electrostatic potential. With some assumptions you can deduce workfunction values. And yes, on a MultiMode with NanoScope IIID this mode is available. But please do not hesitate to elaborate on your question so I can better understand what you are asking. Best, Thomas
    Posted to SPM Digest (Forum) by Thomas Mueller on Fri, Jun 4 2010
  • Re: Sample Prep - nanotubes

    If you are interested in imaging the nanotubes on graphite, you can take a small amount, put it into a strong, volatile organic solvent like chloroform, and sonicate at high power for several minutes to break up the clumps and create a suspension. Very little nanotube material is needed. If you can tell that the suspension is slightly darkened compared
    Posted to SPM Digest (Forum) by Thomas Mueller on Wed, May 26 2010
  • Re: EFM Sample - Picture request

    The lines are Cr, like the pads. The lines are like intedigitated fingers, so when you scan across them, there is an alternation of a line connected to the right pad and subsequent line connected to the opposite pad. And when you connect the wires to a DC voltage source and scan across the fingers in surface potential microscopy mode (Kelvin Probe Force
    Posted to SPM Digest (Forum) by Thomas Mueller on Wed, May 19 2010
  • Re: AFM and TERS

    I think the combination of AFM with Raman is very interesting and there are good reasons why tip-enhanced Raman scattering, despite some challenges, has been a hot research topic in recent years. Below are a few thoughts on its benefits and challenges, please let me know in the forum or offline ( tmueller@veeco.com ) if this is useful and if you have
    Posted to SPM Digest (Forum) by Thomas Mueller on Wed, May 12 2010
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