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Hi Andres, hope, you had a nice Christmas time. You can do the conversion of the ordinates in the following way: The conversion factors from LSB to volts are already given in the parenthesis of the "Z scale"-parameter line, e.g. of data set 2 ("deflection error") @4:Z scale: V [Sens. DeflSens] (0.0003750000 V/LSB) 2.500000 V. Here
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Hi Luís, these curves really strange. I believe, you see some artifact here: the deflection voltage gets very high, such that the non-linearity of the photodiode comes into play. How do the curves on your hard calibration sample look like at similarly high deflection voltages? Do they show a similar curvature? Maybe you need to consider lower
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Thanks a lot, Igor. I have received the pdfs, and will read it very carefully. Hartmut.
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Hi Janne, yes, it is released in the latest version 8.15R3. But you need the QNM-option for that. In the ScanAsyst workspace (standard PF-tapping), the option to change "cature" to "peakforce capture" is not present. What you anyway can use without QNM-key is quantitative Force Volume, which allows same models to be applied to FV
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Dear Igor, I would be heavily interested in that as well...If you send to Ang, maybe you just could include me in your email header: hartmut.stadler@bruker-nano.com Unfortunately, if you are outside university, there is often no access to such articles. One other remark: For operation in air, the NPL in UK did a nice proof as well on polymer samples
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Hi Luis, in my understanding, penetration depth/indentation is the same general quantity as separation, just calculated for situations, where the tip is contact with the sample. So basically, this is calculated from the difference between piezo displacement and cantilever deflection. If you set the piezo displacement to 0 at the contact point, and put
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Hi Jacub, referring to your questions: (1) Not in the standard Litho-library. This needs the full Nanoscript-package. There is a command "SetAFMMode" in NanoScript_Scan.h, which is not available for the simple Litho-scripting functionality. (2) Yes, it switches off feedback and moves the tip in z by the specified distance and the specified
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Hi Mithun, no problem... Btw., I made 2 mistakes in my last post, which might lead you to an error. I was too fast (1) Actually, you should NOT use your very first reference measurement (with all parameters k, R, s, E nominal) for determination of the effective radius. Instead, you should use the reference measurement after you have determined the correct
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Hi Mithun, there is a calibration method, which just needs reference samples. It is particularly good, when you have a sample with at least 2 different materials, e.g. PS-LDPE. Surprisingly, this sample can be used to calibrate a quite wide range of cantilevers, I did that successfully with ScanAsyst-Air, FESP and TESP-type levers. The idea is simple
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Hi Lujie, probe should be ok (it is a quite soft cantilever). However, you might consider the short, thin type (0.32N/m), which is shorter and hence more sensitive. As discussed, skip trying to get a good height signal at first. Try to find the atomic periodicity first in deflection and friction signals. Use small I gain, zero P gain, amd play with