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> Is the QNM mode an additional software? Yes. > Does it require special tips? I m also a bit concerned as my polymer has a very low Young's modulus (15-100KPa) Yes, blind probes, if you want to measure the modulus. > and as far as I understood, the QNM measurements have to be carried out in contact mode and not tapping mode. No, it is
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It depends. You can use just force-volume mode ( Macromolecules, 2012, v.45 (10), p. 4277–4288 ) or the additional Peak-Force QNM ( Langmuir , 2012, 28 (46), pp 16060–16071).
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Dear Colleagues, we invite you to submit your abstract for the symposium on “ Scanning probe microscopy and Nanotechnology ” at the IMRC-2014 meeting The abstract submission deadline is extended to May 16 , more information available on the IMRC-2014 website: http://www.mrs-mexico.org.mx/imrc2014/symposium.php?id_simp=00029 http://www.mrs
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Hi Aaron, I feel there is a mix of two techniques in your questions: AFM indentation and nanoindenter indentation. AFM indentation works well only for relatively soft materials (unless you use very special cantilevers, stiff, very long, with diamond tip, follow special calibration and may still need to use a special mode (lateral correction of the sample
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Dear SPMers, There will be a session "Atomic Force Microscopy in Studying Cell Mechanics and Biointerfaces" (DBIO 04.1.21) at the coming APS meeting, Denver,CO (March 3 -7). Deadline is Nov.15. Hope to see you and your contributions there! --Igor
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Dear Hartmut, Thanks for your interest. I will send you the PDFs and very keen on your opinion. What we showed is essentially that the issue was not in the model (at least only) but in the excessively high stress that produced by the AFM probe for SMALL indentations. Best regards, Igor P.S. I heard about the software upgrade. this is a dream came real
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Dear SPMwers, The discussion about "how quantitative mechanics with AFM can be" was here several times. I promised to publish some proof that it can be quantitative. Finally, we published it: http://pubs.acs.org/doi/abs/10.1021/la302706b . I hope it is convincing enough that PeakForce QNM and HarmoniX modes can indeed be quantitative. If one
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Dear SPMers, We would like to invite you to participate in the coming Symposium "Scanning Probe Microscopy: Frontiers in Nanotechnology" which will be held within MRS Fall Meeting: http://www.mrs.org/f12-cfp-uu/ The deadline for the abstract submission is June 19, 2012 . Session topics will include: SPM applications in electronic devices
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Dear SPMers, Please note a coming symposium related to AFM/SPM (symposium A12 - surface and subsurface analysis) within M&M 2012: http://www.microscopy.org/MandM/2012/M&M2012_CallforPapers.pdf . It is in Phoenix, AZ on July 29-Aug.2, 2012. The deadline for abstract submission is Feb.15 th . Among invited speakers: Chanmin Su (Bruker), Craig
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Hi Dave, You can also use almost any epoxy but when it is "semi-rigidified" . It will be not too snicky to engulf the particles but sticky enough to keep them bound. We used that method before to glue nanoparticles to the AFM tips (J Coll.and Interf.Sci., 2007, v. 310:385), and recently to glue particles of various sizes to a flat surface